smartctl 5.39.1 2010-01-28 r3054 [x86_64-redhat-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Device Model:     Samsung SSD 840 Series
Serial Number:    S14GNEBCB94717J
Firmware Version: DXT06B0Q
User Capacity:    250,059,350,016 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 4c
Local Time is:    Tue Jun 25 14:05:22 2013 JST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)	The previous self-test routine completed
					without error or no self-test has ever 
					been run.
Total time to complete Offline 
data collection: 		 (53956) seconds.
Offline data collection
capabilities: 			 (0x53) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					No Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 (  40) minutes.
SCT capabilities: 	       (0x003d)	SCT Status supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  9 Power_On_Hours          0x0032   099   099   000    Old_age   Always       -       180
 12 Power_Cycle_Count       0x0032   099   099   000    Old_age   Always       -       1
177 Wear_Leveling_Count     0x0013   085   085   000    Pre-fail  Always       -       170
179 Used_Rsvd_Blk_Cnt_Tot   0x0013   100   100   010    Pre-fail  Always       -       0
181 Program_Fail_Cnt_Total  0x0032   100   100   010    Old_age   Always       -       0
182 Erase_Fail_Count_Total  0x0032   100   100   010    Old_age   Always       -       0
183 Runtime_Bad_Block       0x0013   100   100   010    Pre-fail  Always       -       0
187 Reported_Uncorrect      0x0032   100   100   000    Old_age   Always       -       0
190 Airflow_Temperature_Cel 0x0032   056   043   000    Old_age   Always       -       44
195 Hardware_ECC_Recovered  0x001a   200   200   000    Old_age   Always       -       0
199 UDMA_CRC_Error_Count    0x003e   100   100   000    Old_age   Always       -       0
235 Unknown_Attribute       0x0012   100   100   000    Old_age   Always       -       0
241 Total_LBAs_Written      0x0032   099   099   000    Old_age   Always       -       87868757065

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
  255        0    65535  Read_scanning was never started
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.