/linux-4.1.27/Documentation/ABI/stable/ |
D | sysfs-driver-usb-usbtmc | 9 "Universal Serial Bus Test and Measurement Class Specification 23 "Universal Serial Bus Test and Measurement Class, Subclass 35 device as described by the document, "Universal Serial Bus Test 49 this, please see the document, "Universal Serial Bus Test and 61 "Universal Serial Bus Test and Measurement Class Specification
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/linux-4.1.27/drivers/media/platform/xilinx/ |
D | Kconfig | 11 tristate "Xilinx Video Test Pattern Generator" 15 Driver for the Xilinx Video Test Pattern Generator
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/linux-4.1.27/Documentation/networking/ |
D | cs89x0.txt | 43 5.2.1 Diagnostic Self-Test 44 5.2.2 Diagnostic Network Test 380 adapter and its network connection. Use the diagnostics 'Self Test' option to 382 assigned. You can use the diagnostics 'Network Test' to test the ability of the 400 * Select 'Self-Test' to test the adapter's basic functionality. 401 * Select 'Network Test' to test the network connection and cabling. 410 * IO Register Read/Write Test 414 * Shared Memory Test 419 * Interrupt Test 423 * EEPROM Test [all …]
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D | dmfe.txt | 54 Test and make sure PCI latency is now correct for all cases.
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D | iphase.txt | 117 6. Ia Driver Test Using ttcp_atm and PVC
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D | eql.txt | 268 5.1. Randolph Bentson's Test Report
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D | ixgb.txt | 406 UDP Stress Test Dropped Packet Issue
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/linux-4.1.27/drivers/usb/class/ |
D | Kconfig | 41 tristate "USB Test and Measurement Class support" 44 the USB.org specification for USB Test and Measurement devices
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/linux-4.1.27/Documentation/dmaengine/ |
D | dmatest.txt | 1 DMA Test Guide 11 Device Drivers -> DMA Engine support -> DMA Test client 74 Test results are printed to the kernel log buffer with the format:
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/linux-4.1.27/tools/testing/ktest/examples/include/ |
D | defaults.conf | 86 GRUB_MENU = Test Kernel
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/linux-4.1.27/arch/arm/boot/dts/ |
D | vexpress-v2p-ca9.dts | 221 /* Test Chip internal logic voltage */ 248 /* DDR2 SDRAM and Test Chip DDR2 I/O supply */ 266 /* Local board supply for miscellaneous logic external to the Test Chip */
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D | vexpress-v2p-ca5s.dts | 168 /* Test chip gate configuration */
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D | vexpress-v2p-ca15-tc1.dts | 4 * CoreTile Express A15x2 (version with Test Chip 1)
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/linux-4.1.27/drivers/media/platform/vivid/ |
D | Kconfig | 2 tristate "Virtual Video Test Driver"
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/linux-4.1.27/drivers/usb/misc/ |
D | Kconfig | 203 tristate "USB EHSET Test Fixture driver" 206 used for the USB-IF Embedded Host High-Speed Electrical Test procedure. 253 tristate "USB Link Layer Test driver" 256 Layer Test Device. Say Y only when you want to conduct USB Super Speed 257 Link Layer Test for host controllers.
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/linux-4.1.27/Documentation/RCU/ |
D | 00-INDEX | 30 - RCU Torture Test Operation (CONFIG_RCU_TORTURE_TEST)
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D | torture.txt | 1 RCU Torture Test Operation
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/linux-4.1.27/Documentation/devicetree/bindings/arm/ |
D | vexpress-scc.txt | 4 Test chips for ARM Versatile Express platform implement SCC (Serial
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/linux-4.1.27/drivers/staging/android/ion/ |
D | Kconfig | 14 tristate "Ion Test Device"
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/linux-4.1.27/tools/perf/tests/ |
D | attr.py | 119 class Test(object): class 265 Test(f, options).run()
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/linux-4.1.27/Documentation/devicetree/bindings/media/xilinx/ |
D | xlnx,v-tpg.txt | 1 Xilinx Video Test Pattern Generator (TPG)
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/linux-4.1.27/arch/m68k/fpsp040/ |
D | binstr.S | 38 | A6. Test d7. If zero, the digit formed is the ms digit. If non- 111 | A6. Test d7 and branch.
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D | scale.S | 162 | The result exponent is below denorm value. Test for catastrophic 188 | Test for zero. If zero, simply use fmove to return +/- zero
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D | bugfix.S | 177 | Test for cu_savepc equal to zero. If not, this is not a bug 185 | Test the register conflict aspect. If opclass0, check for
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D | x_unfl.S | 159 | Test for fsgldiv and fsglmul. If the inst was one of these, then
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D | res_func.S | 697 | One of the ops is denormalized. Test for wrap condition 801 | One of the ops is denormalized. Test for wrap condition 976 | One of the ops is denormalized. Test for wrap condition 1157 | One of the ops is denormalized. Test for wrap condition 1195 | One of the ops is denormalized. Test for wrap condition
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D | bindec.S | 103 | Test the length of the final exponent string. If the 197 | Test if the normalized input is denormalized
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D | do_func.S | 183 | Test for 1.0 as an input argument, returning +zero. Also check
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D | gen_except.S | 260 | The caller was from an unsupported data type trap. Test if the
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/linux-4.1.27/Documentation/ |
D | unshare.txt | 22 8) Test Specification 265 8) Test Specification 268 1) Valid flags: Test to check that clone flags for signal and 271 2) Missing/implied flags: Test to make sure that if unsharing
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D | java.txt | 76 # CLASS=Test.class 77 # FQCLASS=foo.bar.Test 78 # FQCLASSN=Test
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D | debugging-via-ohci1394.txt | 123 3) Test physical DMA using firescope:
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D | vfio.txt | 186 /* Test the group is viable and available */ 213 /* Test and setup the device */
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D | kernel-parameters.txt | 3159 Test RCU priority boosting? 0=no, 1=maybe, 2=yes. 3170 Test RCU's dyntick-idle handling. See also the
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/linux-4.1.27/arch/arm/lib/ |
D | csumpartialcopygeneric.S | 97 tst dst, #3 @ Test destination alignment 106 tst src, #3 @ Test source alignment
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D | csumpartial.S | 111 tst buf, #3 @ Test destination alignment
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D | div64.S | 51 @ Test for easy paths first.
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/linux-4.1.27/drivers/staging/i2o/ |
D | README | 94 o Test Fibre Channel code
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/linux-4.1.27/Documentation/filesystems/cifs/ |
D | AUTHORS | 45 Test case and Bug Report contributors
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/linux-4.1.27/Documentation/usb/ |
D | chipidea.txt | 15 1.2 Test operations
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/linux-4.1.27/arch/powerpc/boot/dts/fsl/ |
D | bsc9132si-post.dtsi | 39 /* FIXME: Test whether interrupts are split */
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/linux-4.1.27/drivers/i2c/ |
D | Kconfig | 101 tristate "I2C/SMBus Test Stub"
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/linux-4.1.27/drivers/zorro/ |
D | zorro.ids | 45 6100 A3000 Test Fixture [Miscellaneous Expansion Card] 122 07db Hacker Test Board
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/linux-4.1.27/Documentation/locking/ |
D | locktorture.txt | 1 Kernel Lock Torture Test Operation
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D | mutex-design.txt | 140 Test if the mutex is taken:
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/linux-4.1.27/lib/ |
D | Kconfig.debug | 1532 tristate "Linux Kernel Dump Test Tool Module" 1626 tristate "Test functions located in the hexdump module at runtime" 1629 tristate "Test functions located in the string_helpers module at runtime" 1632 tristate "Test kstrto*() family of functions at runtime" 1702 tristate "Test module loading with 'hello world' module" 1716 tristate "Test user/kernel boundary protections" 1729 tristate "Test BPF filter functionality" 1743 tristate "Test firmware loading via userspace interface"
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/linux-4.1.27/Documentation/video4linux/ |
D | vivid.txt | 1 vivid: Virtual Video Test Driver 58 Section 9.1: User Controls - Test Controls 62 Section 9.4.1: Test Pattern Controls 520 Section 9.1: User Controls - Test Controls 575 Section 9.4.1: Test Pattern Controls 578 The Test Pattern Controls are all specific to video capture. 580 Test Pattern: selects which test pattern to use. Use the CSC Colorbar for
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/linux-4.1.27/Documentation/devicetree/ |
D | of_unittest.txt | 23 2. Test-data
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/linux-4.1.27/Documentation/vm/ |
D | hwpoison.txt | 171 Test suite (hwpoison specific portable tests in tsrc)
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D | unevictable-lru.txt | 409 munlock_vma_page() use the Test*PageMlocked() function to handle the case where
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/linux-4.1.27/arch/arm/mach-omap2/ |
D | sleep34xx.S | 501 cmp r1, #0x1 @ Test if L2 re-enable needed on 3630
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/linux-4.1.27/Documentation/trace/ |
D | mmiotrace.txt | 9 Injection Test Harness. In Dec 2006 - Jan 2007, using the code from Intel,
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/linux-4.1.27/arch/m68k/ifpsp060/ |
D | TEST.DOC | 122 print_string("Test passed");
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/linux-4.1.27/Documentation/cgroups/ |
D | memcg_test.txt | 135 SwapCache. Test with shmem/tmpfs is always good test.
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D | memory.txt | 822 Test:
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/linux-4.1.27/Documentation/hwmon/ |
D | w83627ehf | 182 0x50-0x55 and 0x650-0x657 are marked "Test Register" for the EHF, but "Reserved
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/linux-4.1.27/drivers/mtd/devices/ |
D | Kconfig | 148 tristate "Test driver using RAM"
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/linux-4.1.27/arch/cris/arch-v32/kernel/ |
D | entry.S | 510 btstq 16, $r0 ; Test the U-flag.
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/linux-4.1.27/Documentation/scheduler/ |
D | sched-deadline.txt | 18 A. Test suite 351 Appendix A. Test suite
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/linux-4.1.27/kernel/power/ |
D | Kconfig | 163 bool "Test suspend/resume and wakealarm during bootup"
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/linux-4.1.27/Documentation/thermal/ |
D | intel_powerclamp.txt | 45 Test/Analysis has been made in the areas of power, performance,
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/linux-4.1.27/Documentation/power/ |
D | basic-pm-debugging.txt | 39 a) Test modes of hibernation
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/linux-4.1.27/drivers/power/ |
D | Kconfig | 68 tristate "Test power driver"
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/linux-4.1.27/arch/cris/arch-v10/kernel/ |
D | entry.S | 581 btstq 8, $r0 ; Test the U-flag.
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/linux-4.1.27/drivers/dma/ |
D | Kconfig | 477 tristate "DMA Test client"
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/linux-4.1.27/Documentation/scsi/ |
D | ChangeLog.1992-1997 | 381 * scsi.c: Test for Toshiba XM-3401TA and exclude from detection 712 * aha1740.c: Test for NULL pointer in SCtmp. This should not 1028 * pas16.c: Some more minor tweaks. Test for Mediavision board. 1372 * hosts.c: Test for ultrastor card before any of the others.
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D | ChangeLog.sym53c8xx | 138 - Test against expected data transfer direction from SCRIPTS. 148 - Test against expected data transfer direction from SCRIPTS.
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D | aic79xx.txt | 149 - Allow Test Unit Ready commands to take a full 5 seconds
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/linux-4.1.27/Documentation/ioctl/ |
D | ioctl-number.txt | 196 '[' 00-07 linux/usb/tmc.h USB Test and Measurement Devices
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/linux-4.1.27/drivers/usb/gadget/legacy/ |
D | Kconfig | 43 bool "HNP Test Device"
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/linux-4.1.27/Documentation/development-process/ |
D | 5.Posting | 35 - Test the code to the extent that you can. Make use of the kernel's
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/linux-4.1.27/drivers/scsi/aic7xxx/ |
D | aic79xx.reg | 2532 * SCSI Test Control 2815 * 960-MHz Phase-Locked Loop Test Count 2873 * 400-MHz Phase-Locked Loop Test Count
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D | aic79xx.seq | 635 * Test to ensure that the bus has not 821 * Test to ensure that the bus has not 2217 * Test to ensure that the bus has not
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/linux-4.1.27/kernel/trace/ |
D | Kconfig | 532 tristate "Test module for mmiotrace"
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/linux-4.1.27/drivers/message/fusion/lsi/ |
D | mpi_history.txt | 444 * Added Device Self Test to Control Flags of SAS IO Unit
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/linux-4.1.27/drivers/usb/host/ |
D | Kconfig | 781 One such test mode is the Embedded High-speed Host Electrical Test
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/linux-4.1.27/drivers/rtc/ |
D | Kconfig | 118 tristate "Test driver/device"
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/linux-4.1.27/drivers/eisa/ |
D | eisa.ids | 561 HWP2051 "EISA Test Adapter Card"
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/linux-4.1.27/Documentation/s390/ |
D | Debugging390.txt | 1353 TPI (Test pending interrupt) can also be used for polled IO, but in
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/linux-4.1.27/arch/cris/include/uapi/arch-v10/arch/ |
D | sv_addr.agh | 5956 !* Test mode registers
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/linux-4.1.27/arch/m68k/ifpsp060/src/ |
D | fplsp.S | 9312 # Source is outside of 2^14 range. Test the sign and branch
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/linux-4.1.27/ |
D | MAINTAINERS | 6134 LTP (Linux Test Project)
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