Lines Matching refs:of

32 		Major and minor numbers of the character device corresponding
41 		Major and minor numbers of the character device corresponding
42 		to the read-only variant of thie MTD device (in
82 		provides the total number of erase regions.  Otherwise,
90 		Number of OOB bytes per page.
97 		Total size of the device/partition, in bytes.
104 		One of the following ASCII strings, representing the device
117 		In the case of NOR flash it is 1 (even though individual
120 		In the case of NAND flash it is one NAND page (or a
123 		In the case of ECC NOR, it is the ECC block size.
130 		Maximum number of bit errors that the device is capable of
134 		In the case of devices lacking any ECC capability, it is 0.
143 		maximum number of bit errors that were corrected on any single
154 		The introduction of this feature brings a subtle change to the
155 		meaning of the -EUCLEAN return code.  Previously, it was
158 		dangerously high number of bit errors were corrected on one or
159 		more regions comprising an ecc step".  The precise definition of
163 		knowledge of the properties of their device.  Broadly speaking,
165 		block degradation, but high enough to avoid the consequences of
166 		a persistent return value of -EUCLEAN on devices where sticky
181 		The size of a single region covered by ECC, known as the ECC
185 		It will always be a non-negative integer.  In the case of
193 		The number of failures reported by this device's ECC. Typically,
196 		It will always be a non-negative integer.  In the case of
204 		The number of bits that have been corrected by means of the
207 		It will always be a non-negative integer.  In the case of
215 		The number of blocks marked as bad, if any, in this partition.
222 		The number of blocks that are marked as reserved, if any, in
231 		For a partition, the offset of that partition from the start
232 		of the master device in bytes. This attribute is absent on