smartctl 6.2 2013-07-26 r3841 [x86_64-linux-3.13.0-151-generic] (local build) Copyright (C) 2002-13, Bruce Allen, Christian Franke, www.smartmontools.org === START OF INFORMATION SECTION === Device Model: WDC WD40EZRZ-00WN9B0 Serial Number: WD-*****4CLF0HP LU WWN Device Id: 5 0014ee *****e2b0 Firmware Version: 80.00A80 User Capacity: 4,000,787,030,016 bytes [4.00 TB] Sector Sizes: 512 bytes logical, 4096 bytes physical Rotation Rate: 5400 rpm Device is: Not in smartctl database [for details use: -P showall] ATA Version is: ACS-2 (minor revision not indicated) SATA Version is: SATA 3.0, 6.0 Gb/s (current: 3.0 Gb/s) Local Time is: Wed Oct 16 18:03:55 2019 JST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED See vendor-specific Attribute list for marginal Attributes. General SMART Values: Offline data collection status: (0x84) Offline data collection activity was suspended by an interrupting command from host. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: (56040) seconds. Offline data collection capabilities: (0x7b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 2) minutes. Extended self-test routine recommended polling time: ( 560) minutes. Conveyance self-test routine recommended polling time: ( 5) minutes. SCT capabilities: (0x7035) SCT Status supported. SCT Feature Control supported. SCT Data Table supported. SMART Attributes Data Structure revision number: 16 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x002f 159 001 051 Pre-fail Always In_the_past 91000 3 Spin_Up_Time 0x0027 207 171 021 Pre-fail Always - 6633 4 Start_Stop_Count 0x0032 096 096 000 Old_age Always - 4320 5 Reallocated_Sector_Ct 0x0033 200 200 140 Pre-fail Always - 0 7 Seek_Error_Rate 0x002e 200 200 000 Old_age Always - 0 9 Power_On_Hours 0x0032 069 069 000 Old_age Always - 23255 10 Spin_Retry_Count 0x0032 100 100 000 Old_age Always - 0 11 Calibration_Retry_Count 0x0032 100 100 000 Old_age Always - 0 12 Power_Cycle_Count 0x0032 100 100 000 Old_age Always - 356 192 Power-Off_Retract_Count 0x0032 200 200 000 Old_age Always - 47 193 Load_Cycle_Count 0x0032 195 195 000 Old_age Always - 16713 194 Temperature_Celsius 0x0022 123 101 000 Old_age Always - 29 196 Reallocated_Event_Count 0x0032 200 200 000 Old_age Always - 0 197 Current_Pending_Sector 0x0032 200 198 000 Old_age Always - 68 198 Offline_Uncorrectable 0x0030 200 200 000 Old_age Offline - 13 199 UDMA_CRC_Error_Count 0x0032 200 197 000 Old_age Always - 19 200 Multi_Zone_Error_Rate 0x0008 001 001 000 Old_age Offline - 105779 SMART Error Log Version: 1 ATA Error Count: 6 (device log contains only the most recent five errors) CR = Command Register [HEX] FR = Features Register [HEX] SC = Sector Count Register [HEX] SN = Sector Number Register [HEX] CL = Cylinder Low Register [HEX] CH = Cylinder High Register [HEX] DH = Device/Head Register [HEX] DC = Device Command Register [HEX] ER = Error register [HEX] ST = Status register [HEX] Powered_Up_Time is measured from power on, and printed as DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes, SS=sec, and sss=millisec. It "wraps" after 49.710 days. Error 6 occurred at disk power-on lifetime: 1050 hours (43 days + 18 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 f0 64 17 e1 Error: UNC 8 sectors at LBA = 0x011764f0 = 18310384 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 f0 64 17 e1 0a 17:45:05.349 READ DMA c8 00 08 e8 64 17 e1 0a 17:45:05.348 READ DMA c8 00 08 00 10 00 e0 0a 17:45:01.178 READ DMA c8 00 08 20 00 00 e0 0a 17:45:01.177 READ DMA c8 00 08 00 02 00 e0 0a 17:45:01.177 READ DMA Error 5 occurred at disk power-on lifetime: 1050 hours (43 days + 18 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 f0 64 17 e1 Error: UNC 8 sectors at LBA = 0x011764f0 = 18310384 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 f0 64 17 e1 0a 17:44:57.880 READ DMA c8 00 08 e8 64 17 e1 0a 17:44:57.880 READ DMA c8 00 08 00 10 00 e0 0a 17:44:53.761 READ DMA c8 00 08 20 00 00 e0 0a 17:44:53.761 READ DMA c8 00 08 00 02 00 e0 0a 17:44:53.760 READ DMA Error 4 occurred at disk power-on lifetime: 1050 hours (43 days + 18 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 f0 64 17 e1 Error: UNC 8 sectors at LBA = 0x011764f0 = 18310384 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 f0 64 17 e1 0a 17:44:07.586 READ DMA c8 00 08 e8 64 17 e1 0a 17:44:07.030 READ DMA c8 00 08 00 10 00 e0 0a 17:43:37.992 READ DMA c8 00 08 20 00 00 e0 0a 17:43:37.992 READ DMA c8 00 08 00 02 00 e0 0a 17:43:37.992 READ DMA Error 3 occurred at disk power-on lifetime: 1050 hours (43 days + 18 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 f0 64 17 e1 Error: UNC 8 sectors at LBA = 0x011764f0 = 18310384 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 f0 64 17 e1 0a 17:43:34.137 READ DMA c8 00 08 00 10 00 e0 0a 17:43:22.963 READ DMA c8 00 08 20 00 00 e0 0a 17:43:22.963 READ DMA c8 00 08 00 02 00 e0 0a 17:43:22.963 READ DMA c8 00 08 f8 03 00 e0 0a 17:43:22.963 READ DMA Error 2 occurred at disk power-on lifetime: 1050 hours (43 days + 18 hours) When the command that caused the error occurred, the device was active or idle. After command completion occurred, registers were: ER ST SC SN CL CH DH -- -- -- -- -- -- -- 40 51 08 f0 64 17 e1 Error: UNC 8 sectors at LBA = 0x011764f0 = 18310384 Commands leading to the command that caused the error were: CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name -- -- -- -- -- -- -- -- ---------------- -------------------- c8 00 08 f0 64 17 e1 0a 17:43:19.115 READ DMA c8 00 08 00 10 00 e0 0a 17:43:08.566 READ DMA c8 00 08 20 00 00 e0 0a 17:43:08.566 READ DMA c8 00 08 00 02 00 e0 0a 17:43:08.566 READ DMA c8 00 08 f8 03 00 e0 0a 17:43:08.566 READ DMA SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed: read failure 90% 923 18376096 # 2 Short offline Completed: unknown failure 90% 862 - # 3 Short offline Completed: unknown failure 90% 837 - # 4 Short offline Completed: unknown failure 90% 830 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay.