smartctl 7.1 2019-12-30 r5022 [x86_64-linux-5.4.0-135-generic] (local build)
Copyright (C) 2002-19, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: HS-SSD-WAVE(S) 256G
Serial Number: 30107737268
LU WWN Device Id: 5 000000 0000027b6
Firmware Version: HS14825
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Size: 512 bytes logical/physical
Rotation Rate: Solid State Device
Form Factor: 2.5 inches
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: ACS-4 (minor revision not indicated)
SATA Version is: SATA 3.2, 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Mon Sep 18 12:48:11 2023 JST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 0) The previous self-test routine completed
without error or no self-test has ever
been run.
Total time to complete Offline
data collection: ( 33) seconds.
Offline data collection
capabilities: (0x7b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 85) minutes.
Conveyance self-test routine
recommended polling time: ( 2) minutes.
SCT capabilities: (0x0031) SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 20
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0013 100 100 050 Pre-fail Always - 0
9 Power_On_Hours 0x0012 100 100 000 Old_age Always - 0
12 Power_Cycle_Count 0x0012 100 100 000 Old_age Always - 2
167 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 0
168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
169 Unknown_Attribute 0x0013 100 100 010 Pre-fail Always - 327690
170 Unknown_Attribute 0x0033 100 100 010 Pre-fail Always - 100
171 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
172 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 0
174 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 0
175 Program_Fail_Count_Chip 0x0022 100 100 010 Old_age Always - 0
177 Wear_Leveling_Count 0x0012 100 100 000 Old_age Always - 0
180 Unused_Rsvd_Blk_Cnt_Tot 0x0033 100 100 000 Pre-fail Always - 25
183 Runtime_Bad_Block 0x0033 100 100 000 Pre-fail Always - 0
184 End-to-End_Error 0x003b 100 100 090 Pre-fail Always - 0
192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 2
194 Temperature_Celsius 0x0022 032 032 000 Old_age Always - 32 (Min/Max 28/32)
196 Reallocated_Event_Count 0x0012 100 100 000 Old_age Always - 0
197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0
199 UDMA_CRC_Error_Count 0x0032 100 100 000 Old_age Always - 0
206 Unknown_SSD_Attribute 0x0032 200 200 000 Old_age Always - 1
207 Unknown_SSD_Attribute 0x0032 200 200 000 Old_age Always - 2
208 Unknown_SSD_Attribute 0x0032 200 200 000 Old_age Always - 1
231 Temperature_Celsius 0x0023 100 100 005 Pre-fail Always - 0
233 Media_Wearout_Indicator 0x0032 100 100 000 Old_age Always - 0
234 Unknown_Attribute 0x0032 100 100 000 Old_age Always - 1
241 Total_LBAs_Written 0x0032 100 100 000 Old_age Always - 8
242 Total_LBAs_Read 0x0032 100 100 000 Old_age Always - 0
SMART Error Log Version: 1
No Errors Logged
SMART Self-test log structure revision number 1
No self-tests have been logged. [To run self-tests, use: smartctl -t]
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.