[root@catbox /home/furuta]# smartctl /dev/sda
smartctl 5.39.1 2010-01-28 r3054 [x86_64-redhat-linux-gnu] (local build)
Copyright (C) 2002-10 by Bruce Allen, http://smartmontools.sourceforge.net

=== START OF INFORMATION SECTION ===
Device Model:     Samsung SSD 840 Series
Serial Number:    S14GNEBCB94717J
Firmware Version: DXT06B0Q
User Capacity:    250,059,350,016 bytes
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   8
ATA Standard is:  ATA-8-ACS revision 4c
Local Time is:    Mon Sep 23 21:02:56 2013 JST
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status:      (   0)The previous self-test routine completed
without error or no self-test has ever 
been run.
Total time to complete Offline 
data collection:  (53956) seconds.
Offline data collection
capabilities:  (0x53) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
No Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities:            (0x0003)Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability:        (0x01)Error logging supported.
General Purpose Logging supported.
Short self-test routine 
recommended polling time:  (   2) minutes.
Extended self-test routine
recommended polling time:  (  40) minutes.
SCT capabilities:        (0x003d)SCT Status supported.
SCT Feature Control supported.
SCT Data Table supported.

SMART Attributes Data Structure revision number: 1
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  5 Reallocated_Sector_Ct   0x0033   098   098   010    Pre-fail  Always       -       70
  9 Power_On_Hours          0x0032   099   099   000    Old_age   Always       -       2347
 12 Power_Cycle_Count       0x0032   099   099   000    Old_age   Always       -       1
177 Wear_Leveling_Count     0x0013   001   001   000    Pre-fail  Always       -       2736
179 Used_Rsvd_Blk_Cnt_Tot   0x0013   098   098   010    Pre-fail  Always       -       70
181 Program_Fail_Cnt_Total  0x0032   100   100   010    Old_age   Always       -       0
182 Erase_Fail_Count_Total  0x0032   100   100   010    Old_age   Always       -       0
183 Runtime_Bad_Block       0x0013   098   098   010    Pre-fail  Always       -       70
187 Reported_Uncorrect      0x0032   099   099   000    Old_age   Always       -       412
190 Airflow_Temperature_Cel 0x0032   077   038   000    Old_age   Always       -       23
195 Hardware_ECC_Recovered  0x001a   200   200   000    Old_age   Always       -       412
199 UDMA_CRC_Error_Count    0x003e   100   100   000    Old_age   Always       -       0
235 Unknown_Attribute       0x0012   100   100   000    Old_age   Always       -       0
241 Total_LBAs_Written      0x0032   099   099   000    Old_age   Always       -       1355789298747

SMART Error Log Version: 1
No Errors Logged

SMART Self-test log structure revision number 1
No self-tests have been logged.  [To run self-tests, use: smartctl -t]


SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
  255        0    65535  Read_scanning was never started
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.